…issues can be expected with TAG. TAG is a multivariate algorithm to detect outliers. TAG is used when outliers detection is critical for reliability or security reasons.

Developed in partnership with Toulouse institute of mathematics and Toulouse university, TAG is the ultimate zero defect tool.

GAT is designed for low sample size and high dimension (HDLSS).

Its objective is to select the very few best parts out of a population.

GAT includes a double algorithm to keep only the center of the distribution, the most reliable parts.

It is based on a set of statistical analyses adapted to any kind of parameters.

Yield has been improved by several percents in semiconductor manufacturing and drug quality has been improved in pharmaceutical industry with YETI.

CHAM is a solution developed by ippon innovation to detect minor anomalies on sensors curves, process or metrology tool parameters or any signal.

Statistical analysis is applied on temporal curves, multiple parameters or any simple or complex signal.