semiconductor, biostatistics, aeronautics, automotive, pharmaceutical, nuclear and space industry ...

Company
Ippon Innovation, headquartered in Toulouse, France, was created by François Bergeret, PhD in statistics from the University of Toulouse, who held various positions in R&D, production and quality for 15 years with Motorola and Freescale (now NXP). Ippon has very strong links with Galaxy Semiconductor, which industrializes and markets solutions for microelectronics.
Ippon Innovation is now a team of high level Data Scientists working in semiconductor, medical, aerospace, food industry... For example, solutions for process & yield optimization, outliers detection, test time reduction are developed.
Ippon Learning also proposes training and consulting in Lean Six Sigma(Black Belt, Green Belt), Statistics (DOE, SPC, modeling, data science...), Quality Methods (FMEA, Problem Solving...), Metrology (ISO17020, ISO17025...).
For R&D, Ippon Innovation collaborates with Toulouse University, INSA (applied mathematics) and also with the Midi Pyrénées Region and the European Union.
As JMP business partner ( www.jmp.com), Ippon Innovation and Ippon Learning have developed a strong expertise with JMP software including: advanced scripting, consulting and training.
Some customers:





















Solutions
Ippon proposes innovative solutions to improve the reliability of your products,yield, process and cost of test.
Reliability GAT is in production for our semiconductor and pharmaceutical customers.
GAT objective is to select anomalies by techniques of outlier ensembles.
GAT is designed for data of any dimension, including low sample size and high dimension (HDLSS).
GAT includes a double unsupervised algorithm to identify outlier items and can be applied in various fields.
Developed in partnership with Toulouse university, GAT is the ultimate zero defect tool.
It is based on a set of statistical analyses adapted to any kind of parameters.
Yield has been improved by several percents in semiconductor manufacturing and drug quality has been improved in pharmaceutical industry with YETI.
CHAM is a solution developed by ippon innovation to detect anomalies on sensors curves, process or metrology tool parameters or any weak signal.
Statistical analysis is applied on temporal curves, multiple parameters or any simple or complex signal, in particular images.

Learning






Lean Six Sigma and Metrology






NEWS
Information, news from Ippon

reliability
2 ippon’s statisticians are co-authors at the ESREF conference and in the Microelectronics Reliability journal "New reliability model for power SiC MOSFET technologies under static and dynamic gate stress" with IRT Saint Exupery.
20.11.2023

aeronautics
Our statistical control solutions are already in place at a major player in electronic box testing, and optimal planning of test workshops is underway.
02.07.2023

GAT
GAT used to select the best GaN components for space applications.
01.07.2023

Silicon Carbide
Creation of a database. Retrieving data from several sources, processing and feeding the database with Python. Creation of a JMP user interface to extract data from the database