INNOVATION
Statistical Expertise
and
Advanced Algorithms
Ippon Innovation, 10 years of Statistics and Big Data! We are now expanding into
semiconductor, biostatistics, aeronautics, automotive, pharmaceutical and space industry...

Company

Based in Toulouse, France, Ippon Innovation was created by François Bergeret, PhD in statistics from Paul Sabatier University. He has worked in R&D, production and quality during 15 years at Motorola and Freescale (now NXP). He is a Master Black Belt, teaching statistics and Six Sigma in various companies and universities.

Ippon Innovation is now a team of high level Data Scientists working in semiconductor, medical, aerospace, food industry... For example, solutions for process & yield optimization, outliers detection, test time reduction are developed.
Our partner SIEMENS industrializes and commercializes our solutions for the semiconductor industry.
Ippon Learning also proposes training and consulting in Lean Six Sigma(Black Belt, Green Belt), Statistics (DOE, SPC, modeling, data science...), Quality Methods (FMEA, Problem Solving...), Metrology (ISO17020, ISO17025...).

For R&D, Ippon Innovation collaborates with Toulouse University, INSA (applied mathematics) and also with the Midi Pyrénées Region and the European Union. Ippon Innovation and Ippon Learning have developed a strong expertise with JMP software including: advanced scripting, consulting and training.

Some customers:

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Solutions

Ippon proposes innovative solutions to improve the reliability of your products,
yield, process and cost of test.
  • TAG
  • GAT
  • YETI
  • CHAMP
For
Zero Defect
TAG is used in automotive industry for example: 20% to 30% reduction of customer…

…issues can be expected with TAG. TAG is a multivariate algorithm to detect outliers. TAG is used when outliers detection is critical for reliability or security reasons.

Developed in partnership with Toulouse institute of mathematics and Toulouse university, TAG is the ultimate zero defect tool.

For High
Reliability
GAT is useful for space industry, aeronautics and defense for example.

GAT is designed for low sample size and high dimension (HDLSS).

Its objective is to select the very few best parts out of a population.

GAT includes a double algorithm to keep only the center of the distribution, the most reliable parts.

To improve processes & yield YETI is a software that finds root causes of issues in complex processes.

It is based on a set of statistical analyses adapted to any kind of parameters.

Yield has been improved by several percents in semiconductor manufacturing and drug quality has been improved in pharmaceutical industry with YETI.

To detect abnormal signal

CHAM is a solution developed by ippon innovation to detect minor anomalies on sensors curves, process or metrology tool parameters or any signal.

Statistical analysis is applied on temporal curves, multiple parameters or any simple or complex signal.

Learning

Lean Six Sigma
Six Sigma Green Belt or Black Belt with certification
Training for Six Sigma Managers
Coaching for Lean or Six Sigma projects

Statistics and software
Design of Experiments
Industrial Statistics
Data Science
Statistical Software (R and python)
JMP Fundamentals
Statistical Process Control

Quality and Métrology
FMEA
8D (Problem Solving)
Quality Tools and Methods
Quality Norms: ISO 9001, ISO/TS 16949
Metrolgy and Statistics
Metrology norms: ISO 17020, ISO 17025

Other
Econometry
Any complex statistical study
Ippon Learning proposes a large set of trainings,
standard or customized, in class or e-learning based.

For more information on trainings, pleasecontact us.

NEWS

Information, news from Ippon

Previous Next
10 years old!

10 years old!

Ippon is 10 years old this summer, we are now 6 data scientists and continue to offer statistical services and innovative solutions for high reliability!

01.09.2017

GAT MMR

GAT MMR

Publication on outlier detection in high dimension low sample size by a non supervised method at the MMR conference (http://mmr2017.imag.fr/). Available paper on demand.

05.07.2017

BIG DATA

BIG DATA

We have successfully processed functional flight test big data, with an automatic tool delivered to detect outlier flights.

10.06.2017

Contact

IPPON Innovation

Office: 8 esplanade compans caffarelli
31000 Toulouse,
France

33 (0)6 72 05 62 76

admin@ippon-innov.eu

 
 
 
 
 
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