Ippon Innovation, 14 years of Statistics and Big Data through Artificial Intelligence! We are now expanding into
semiconductor, biostatistics, aeronautics, automotive, pharmaceutical, nuclear and space industry ...

Company

Based in Toulouse, France, Ippon Innovation was created by François Bergeret, PhD in statistics from Paul Sabatier University. He has worked in R&D, production and quality during 15 years at Motorola and Freescale (now NXP). He is a Master Black Belt, teaching statistics and Six Sigma in various companies and universities.

Ippon Innovation is now a team of high level Data Scientists working in semiconductor, medical, aerospace, food industry... For example, solutions for process & yield optimization, outliers detection, test time reduction are developed.

Ippon Learning also proposes training and consulting in Lean Six Sigma(Black Belt, Green Belt), Statistics (DOE, SPC, modeling, data science...), Quality Methods (FMEA, Problem Solving...), Metrology (ISO17020, ISO17025...).

For R&D, Ippon Innovation collaborates with Toulouse University, INSA (applied mathematics) and also with the Midi Pyrénées Region and the European Union.

As JMP business partner ( www.jmp.com), Ippon Innovation and Ippon Learning have developed a strong expertise with JMP software including: advanced scripting, consulting and training.

Some customers:

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Solutions

Ippon proposes innovative solutions to improve the reliability of your products,
yield, process and cost of test.
  • GAT
  • YETI
  • CHAMP
For High
Reliability
GAT is in production for our semiconductor and pharmaceutical customers.

GAT objective is to select anomalies by techniques of outlier ensembles.

GAT is designed for data of any dimension, including low sample size and high dimension (HDLSS).

GAT includes a double unsupervised algorithm to identify outlier items and can be applied in various fields.

Developed in partnership with Toulouse university, GAT is the ultimate zero defect tool.

To improve processes & yield YETI is a software that finds root causes of issues in complex processes.

It is based on a set of statistical analyses adapted to any kind of parameters.

Yield has been improved by several percents in semiconductor manufacturing and drug quality has been improved in pharmaceutical industry with YETI.

To detect abnormal signal CHAM is used by a major energy company

CHAM is a solution developed by ippon innovation to detect anomalies on sensors curves, process or metrology tool parameters or any weak signal.

Statistical analysis is applied on temporal curves, multiple parameters or any simple or complex signal, in particular images.

Learning

Statistics
Statistics and Modeling
Data Science
Outlier Detection
Design of Experiments
Statistical Process Control
JMP Fundamentals

Lean Six Sigma and Metrology
Green Belt and Black Belt with certification IASSC
Design For Six Sigma - DFSS
Measurement System Analysis and Metrology
Metrology norms: ISO 17020, ISO 17025
Ippon Learning proposes a large set of trainings,
standard or customized, in class or e-learning based.

For more information on trainings, please contact us.

NEWS

Information, news from Ippon

Previous Next
Industry of the Future

Industry of the Future

Our client SOITEC received the "Industry of the Future" trophy, for improving yields on which ippon has worked!

01.09.2021

ANSM TRAINING

ANSM TRAINING

Our statistical training series for the ANSM (French Medicines Safety Agency) began in September

15.09.2021

OUTLIER DETECTION

OUTLIER DETECTION

Our outlier detection and functional data training has been given in the aerospace and automotive industry by one of our subject matter experts.

06.05.2021