and
semiconductor, biostatistics, aeronautics, automotive, pharmaceutical and space industry...
Company
Based in Toulouse, France, Ippon Innovation was created by François Bergeret, PhD in statistics from Paul Sabatier University. He has worked in R&D, production and quality during 15 years at Motorola and Freescale (now NXP). He is a Master Black Belt, teaching statistics and Six Sigma in various companies and universities.Ippon Innovation is now a team of high level Data Scientists working in semiconductor, medical, aerospace, food industry... For example, solutions for process & yield optimization, outliers detection, test time reduction are developed.
Our partner SIEMENS industrializes and commercializes our solutions for the semiconductor industry. Ippon Learning also proposes training and consulting in Lean Six Sigma(Black Belt, Green Belt), Statistics (DOE, SPC, modeling, data science...), Quality Methods (FMEA, Problem Solving...), Metrology (ISO17020, ISO17025...).
For R&D, Ippon Innovation collaborates with Toulouse University, INSA (applied mathematics) and also with the Midi Pyrénées Region and the European Union. Ippon Innovation and Ippon Learning have developed a strong expertise with JMP software including: advanced scripting, consulting and training.
Some customers:
Solutions
Ippon proposes innovative solutions to improve the reliability of your products,yield, process and cost of test.
Zero Defect TAG is used in automotive industry for example: 20% to 30% reduction of customer…
…issues can be expected with TAG. TAG is a multivariate algorithm to detect outliers. TAG is used when outliers detection is critical for reliability or security reasons.
Developed in partnership with Toulouse institute of mathematics and Toulouse university, TAG is the ultimate zero defect tool.
Reliability GAT is useful for space industry, aeronautics and defense for example.
GAT is designed for low sample size and high dimension (HDLSS).
Its objective is to select the very few best parts out of a population.
GAT includes a double algorithm to keep only the center of the distribution, the most reliable parts.
It is based on a set of statistical analyses adapted to any kind of parameters.
Yield has been improved by several percents in semiconductor manufacturing and drug quality has been improved in pharmaceutical industry with YETI.
CHAM is a solution developed by ippon innovation to detect minor anomalies on sensors curves, process or metrology tool parameters or any signal.
Statistical analysis is applied on temporal curves, multiple parameters or any simple or complex signal.
Learning
Lean Six Sigma
Six Sigma Green Belt or Black Belt with certificationTraining for Six Sigma ManagersCoaching for Lean or Six Sigma projectsStatistics and software
Design of ExperimentsIndustrial StatisticsData ScienceStatistical Software (R and python)JMP Fundamentals Statistical Process ControlQuality and Métrology
FMEA8D (Problem Solving) Quality Tools and MethodsQuality Norms: ISO 9001, ISO/TS 16949Metrolgy and Statistics Metrology norms: ISO 17020, ISO 17025Other
EconometryAny complex statistical study
standard or customized, in class or e-learning based.
For more information on trainings, pleasecontact us.
NEWS
Information, news from Ippon
10 years old!
Ippon is 10 years old this summer, we are now 6 data scientists and continue to offer statistical services and innovative solutions for high reliability!
01.09.2017
GAT MMR
Publication on outlier detection in high dimension low sample size by a non supervised method at the MMR conference (http://mmr2017.imag.fr/). Available paper on demand.
05.07.2017
BIG DATA
We have successfully processed functional flight test big data, with an automatic tool delivered to detect outlier flights.
10.06.2017
Contact
IPPON Innovation
Office: 8 esplanade compans caffarelli
31000 Toulouse,
France
33 (0)6 72 05 62 76
admin@ippon-innov.eu