semiconductor, biostatistics, aeronautics, automotive, pharmaceutical, nuclear and space industry ...
Company
Based in Toulouse, France, Ippon Innovation was created by François Bergeret, PhD in statistics from Paul Sabatier University. He has worked in R&D, production and quality during 15 years at Motorola and Freescale (now NXP). He is a Master Black Belt, teaching statistics and Six Sigma in various companies and universities.
Ippon Innovation is now a team of high level Data Scientists working in semiconductor, medical, aerospace, food industry... For example, solutions for process & yield optimization, outliers detection, test time reduction are developed.
Ippon Learning also proposes training and consulting in Lean Six Sigma(Black Belt, Green Belt), Statistics (DOE, SPC, modeling, data science...), Quality Methods (FMEA, Problem Solving...), Metrology (ISO17020, ISO17025...).
For R&D, Ippon Innovation collaborates with Toulouse University, INSA (applied mathematics) and also with the Midi Pyrénées Region and the European Union.
As JMP business partner ( www.jmp.com), Ippon Innovation and Ippon Learning have developed a strong expertise with JMP software including: advanced scripting, consulting and training.
Some customers:
Solutions
Ippon proposes innovative solutions to improve the reliability of your products,yield, process and cost of test.
For High
Reliability GAT is in production for our semiconductor and pharmaceutical customers.
Reliability GAT is in production for our semiconductor and pharmaceutical customers.
GAT objective is to select anomalies by techniques of outlier ensembles.
GAT is designed for data of any dimension, including low sample size and high dimension (HDLSS).
GAT includes a double unsupervised algorithm to identify outlier items and can be applied in various fields.
Developed in partnership with Toulouse university, GAT is the ultimate zero defect tool.
To improve processes & yield
YETI is a software that finds root causes of issues in complex processes.
It is based on a set of statistical analyses adapted to any kind of parameters.
Yield has been improved by several percents in semiconductor manufacturing and drug quality has been improved in pharmaceutical industry with YETI.
To detect abnormal signal
CHAM is used by a major energy company
CHAM is a solution developed by ippon innovation to detect anomalies on sensors curves, process or metrology tool parameters or any weak signal.
Statistical analysis is applied on temporal curves, multiple parameters or any simple or complex signal, in particular images.
Learning
Statistics
Statistics and Modeling
Data Science
Outlier Detection
Design of Experiments
Statistical Process Control
JMP Fundamentals
Lean Six Sigma and Metrology
Green Belt and Black Belt with certification IASSC
Design For Six Sigma - DFSS
Measurement System Analysis and Metrology
Metrology norms: ISO 17020, ISO 17025
Statistics and ModelingData ScienceOutlier DetectionDesign of ExperimentsStatistical Process ControlJMP FundamentalsLean Six Sigma and Metrology
Green Belt and Black Belt with certification IASSCDesign For Six Sigma - DFSSMeasurement System Analysis and MetrologyMetrology norms: ISO 17020, ISO 17025
Ippon Learning proposes a large set of trainings,
standard or customized, in class or e-learning based.
standard or customized, in class or e-learning based.
For more information on trainings, please contact us.
NEWS
Information, news from Ippon
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occitanie region
The patents for our GAT and CHAM solutions, for detecting parts and atypical curves from sensors, are in the process of being extended internationally. We thank the Occitanie region for its support.
12.04.2022
NEW OFFICES
Our team is proud to inaugurate and welcome its clients to our new offices in the center of Toulouse.
01.10.2021
ANSM TRAINING
Our statistical training series for the ANSM (French Medicines Safety Agency) began in September
15.09.2021
Industry of the Future
Our client SOITEC received the "Industry of the Future" trophy, for improving yields on which ippon has worked!