Ippon Innovation, 14 years of Statistics and Big Data through Artificial Intelligence! We are now expanding into
semiconductor, biostatistics, aeronautics, automotive, pharmaceutical, nuclear and space industry ...

Company

Based in Toulouse, France, Ippon Innovation was created by François Bergeret, PhD in statistics from Paul Sabatier University. He has worked in R&D, production and quality during 15 years at Motorola and Freescale (now NXP). He is a Master Black Belt, teaching statistics and Six Sigma in various companies and universities.

Ippon Innovation is now a team of high level Data Scientists working in semiconductor, medical, aerospace, food industry... For example, solutions for process & yield optimization, outliers detection, test time reduction are developed.

Ippon Learning also proposes training and consulting in Lean Six Sigma(Black Belt, Green Belt), Statistics (DOE, SPC, modeling, data science...), Quality Methods (FMEA, Problem Solving...), Metrology (ISO17020, ISO17025...).

For R&D, Ippon Innovation collaborates with Toulouse University, INSA (applied mathematics) and also with the Midi Pyrénées Region and the European Union.

As JMP business partner ( www.jmp.com), Ippon Innovation and Ippon Learning have developed a strong expertise with JMP software including: advanced scripting, consulting and training.

Some customers:

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Solutions

Ippon proposes innovative solutions to improve the reliability of your products,
yield, process and cost of test.
  • TAG
  • GAT
  • YETI
  • CHAMP
For
Zero Defect
TAG is used in automotive industry for example: 20% to 30% reduction of customer…

…issues can be expected with TAG. TAG is a multivariate algorithm to detect outliers. TAG is used when outliers detection is critical for reliability or security reasons.

For High
Reliability
GAT is in production for our semiconductor and pharmaceutical customers.

GAT objective is to select anomalies by techniques of outlier ensembles.

GAT is designed for data of any dimension, including low sample size and high dimension (HDLSS).

GAT includes a double unsupervised algorithm to identify outlier items and can be applied in various fields.

Developed in partnership with Toulouse university, GAT is the ultimate zero defect tool.

To improve processes & yield YETI is a software that finds root causes of issues in complex processes.

It is based on a set of statistical analyses adapted to any kind of parameters.

Yield has been improved by several percents in semiconductor manufacturing and drug quality has been improved in pharmaceutical industry with YETI.

To detect abnormal signal CHAM is used by a major energy company

CHAM is a solution developed by ippon innovation to detect minor anomalies on sensors curves, process or metrology tool parameters or any weak signal.

Statistical analysis is applied on temporal curves, multiple parameters or any simple or complex signal, in particular images.

Learning

Six Sigma Green Belt or Black Belt with certification
Training for Six Sigma Managers
Coaching for Lean or Six Sigma projects

Statistics and software
Design of Experiments
Industrial Statistics
Data Science
Statistical Software (R and python)
JMP Fundamentals
Statistical Process Control

Quality and Métrology
FMEA
8D (Problem Solving)
Quality Tools and Methods
Quality Norms: ISO 9001, ISO/TS 16949
Metrolgy and Statistics
Metrology norms: ISO 17020, ISO 17025

Other
Econometry
Any complex statistical study
Ippon Learning proposes a large set of trainings,
standard or customized, in class or e-learning based.

For more information on trainings, pleasecontact us.

NEWS

Information, news from Ippon

Previous Next
DETECTION OF ATYPICAL curves

DETECTION OF ATYPICAL curves

CHAM is used by a major energy company to control a complex process.

05.01.2021

PROCESS OPTIMIZATION AND ZERO DEFECT

PROCESS OPTIMIZATION AND ZERO DEFECT

Two new licences have just been delivered, one for the pharmaceutical industry and the other for microelectronics.

17.11.2020

AWS and Process Control

AWS and Process Control

Ippon has implemented solutions interfaced with AWS to control quality and processes for a key player in the semiconductor industry.

14.10.2020