Ippon Innovation, 14 years of Statistics and Big Data through Artificial Intelligence! We are now expanding into
semiconductor, biostatistics, aeronautics, automotive, pharmaceutical, nuclear and space industry ...

Company

Based in Toulouse, France, Ippon Innovation was created by François Bergeret, PhD in statistics from Paul Sabatier University. He has worked in R&D, production and quality during 15 years at Motorola and Freescale (now NXP). He is a Master Black Belt, teaching statistics and Six Sigma in various companies and universities.

Ippon Innovation is now a team of high level Data Scientists working in semiconductor, medical, aerospace, food industry... For example, solutions for process & yield optimization, outliers detection, test time reduction are developed.

Ippon Learning also proposes training and consulting in Lean Six Sigma(Black Belt, Green Belt), Statistics (DOE, SPC, modeling, data science...), Quality Methods (FMEA, Problem Solving...), Metrology (ISO17020, ISO17025...).

For R&D, Ippon Innovation collaborates with Toulouse University, INSA (applied mathematics) and also with the Midi Pyrénées Region and the European Union.

As JMP business partner ( www.jmp.com), Ippon Innovation and Ippon Learning have developed a strong expertise with JMP software including: advanced scripting, consulting and training.

Some customers:

Solutions

Ippon proposes innovative solutions to improve the reliability of your products,
yield, process and cost of test.

For
Zero Defect TAG is used in automotive industry for example: 20% to 30% reduction of customer…

…issues can be expected with TAG. TAG is a multivariate algorithm to detect outliers. TAG is used when outliers detection is critical for reliability or security reasons.

For High
Reliability GAT is in production for our semiconductor and pharmaceutical customers.

GAT objective is to select anomalies by techniques of outlier ensembles.

GAT is designed for data of any dimension, including low sample size and high dimension (HDLSS).

GAT includes a double unsupervised algorithm to identify outlier items and can be applied in various fields.

Developed in partnership with Toulouse university, GAT is the ultimate zero defect tool.

To improve processes & yield YETI is a software that finds root causes of issues in complex processes.

It is based on a set of statistical analyses adapted to any kind of parameters.

Yield has been improved by several percents in semiconductor manufacturing and drug quality has been improved in pharmaceutical industry with YETI.

To detect abnormal signal CHAM is used by a major energy company

CHAM is a solution developed by ippon innovation to detect minor anomalies on sensors curves, process or metrology tool parameters or any weak signal.

Statistical analysis is applied on temporal curves, multiple parameters or any simple or complex signal, in particular images.